Tiny-scale "stealth" current sensor to probe power semiconductor device failure. - Yuya Kasho; Hidetoshi Hirai; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2011)

"Design for EMI" approach on power PiN diode reverse recovery. - Masanori Tsukuda; Keiichiro Kawakami; Kenichi Takahama; Ichiro Omura (Microelectron. Reliab., 2011)

Real time degradation monitoring system for high power IGBT module under power cycling test. - Akihiko Watanabe; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2013)

Short-circuit protection for an IGBT with detecting the gate voltage and gate charge. - Kazunori Hasegawa; Kenichi Yamamoto; Hidetaro Yoshida; Kota Hamada; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2014)

Structure oriented compact model for advanced trench IGBTs without fitting parameters for extreme condition: Part II. - Junpei Takaishi; Syohei Harada; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2014)

16-Channel micro magnetic flux sensor array for IGBT current distribution measurement. - H. Tomonaga; Masanori Tsukuda; S. Okoda; R. Noda; K. Tashiro; Ichiro Omura (Microelectron. Reliab., 2015)

High-throughput and full automatic DBC-module screening tester for high power IGBT. - Masanori Tsukuda; H. Tomonaga; S. Okoda; R. Noda; K. Tashiro; Ichiro Omura (Microelectron. Reliab., 2015)

Failure analysis of power devices based on real-time monitoring. - Akihiko Watanabe; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2015)

Micro PCB Rogowski coil for current monitoring and protection of high voltage power modules. - Masanori Tsukuda; Masahiro Koga; Kenta Nakashima; Ichiro Omura (Microelectron. Reliab., 2016)

Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications. - Seiya Abe; Kazunori Hasegawa; Masanori Tsukuda; Keiji Wada; Ichiro Omura; Tamotsu Ninomiya (Microelectron. Reliab., 2017)

Clamp type built-in current sensor using PCB in high-voltage power modules. - Masanori Tsukuda; K. Nakashima; S. Tabata; Kazunori Hasegawa; Ichiro Omura (Microelectron. Reliab., 2017)

Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system. - Bat-Otgon Bat-Ochir; Battuvshin Bayarkhuu; Kazunori Hasegawa; Masanori Tsukuda; Bayasgalan Dugarjav; Ichiro Omura (Microelectron. Reliab., 2018)

A fully digital feedback control of gate driver for current balancing of parallel connected power devices. - Ravi N. Tripathi; Masanori Tsukuda; Ichiro Omura (Microelectron. Reliab., 2018)

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena. - Masanori Tsukuda; Seiya Abe; Kazunori Hasegawa; Tamotsu Ninomiya; Ichiro Omura (Microelectron. Reliab., 2018)

Switching of 3300V Scaled IGBT by 5V Gate Drive. - Toshiro Hiramoto; Katsumi Satoh; Tomoko Matsudai; Wataru Saito; Kuniyuki Kakushima; Takuya Hoshii; Kazuyoshi Furukawa; Masahiro Watanabe; Naoyuki Shigyo; Hitoshi Wakabayashi; Kazuo Tsutsui; Hiroshi Iwai; et al. (ASICON, 2019)