CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. - Kazunari Enokimoto; Xiaoqing Wen; Yuta Yamato; Kohei Miyase; H. Sone; Seiji Kajihara; Masao Aso; Hiroshi Furukawa (Asian Test Symposium, 2009)

Transition-Time-Relation based capture-safety checking for at-speed scan test generation. - Kohei Miyase; Xiaoqing Wen; Masao Aso; Hiroshi Furukawa; Yuta Yamato; Seiji Kajihara (DATE, 2011)

A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. - Kohei Miyase; Masao Aso; Ryou Ootsuka; Xiaoqing Wen; Hiroshi Furukawa; Yuta Yamato; Kazunari Enokimoto; Seiji Kajihara (VTS, 2012)

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing. - Kohei Miyase; Ryota Sakai; Xiaoqing Wen; Masao Aso; Hiroshi Furukawa; Yuta Yamato; Seiji Kajihara (IEICE Trans. Inf. Syst., 2013)

On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test. - Yousuke Miyake; Takaaki Kato; Seiji Kajihara; Masao Aso; Haruji Futami; Satoshi Matsunaga; Yukiya Miura (IOLTS, 2020)

Innovative Test Practices in Asia. - Takeshi Iwasaki; Masao Aso; Haruji Futami; Satoshi Matsunaga; Yousuke Miyake; Takaaki Kato; Seiji Kajihara; Yukiya Miura; Smith Lai; Gavin Hung; Harry H. Chen; Haruo Kobayashi 001; et al. (VTS, 2020)