Learning Non-linear Dynamical Systems by Alignment of Local Linear Models. - Masao Joko; Yoshinobu Kawahara; Takehisa Yairi (ICPR, 2010)

Wafer Defect Root Cause Analysis with Partial Trajectory Regression. - Kohei Miyaguchi; Masao Joko; Rebekah Sheraw; Tsuyoshi Idé (CoRR, 2025)

Sequence-Aware Inline Measurement Attribution for Good-Bad Wafer Diagnosis. - Kohei Miyaguchi; Masao Joko; Rebekah Sheraw; Tsuyoshi Idé (CoRR, 2025)