Reliability of Diode-Integrated SiC Power MOSFET(DioMOS). - Osamu Kusumoto; Atsushi Ohoka; Nobuyuki Horikawa; Kohtaro Tanaka; Masahiko Niwayama; Masao Uchida; Yoshihiko Kanzawa; Kazuyuki Sawada; Tetsuzo Ueda (Microelectron. Reliab., 2016)

InSAR Detection and Field Evidence for Thermokarst after a Tundra Wildfire, Using ALOS-PALSAR. - Go Iwahana; Masao Uchida; Lin Liu 010; Wenyu Gong; Franz J. Meyer; Richard M. Guritz; Tsutomu Yamanokuchi; Larry D. Hinzman (Remote. Sens., 2016)