A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq. - Masaru Sanada (VTS, 1996)

Defect detection from visual abnormalities in manufacturing process using IDDQ. - Masaru Sanada (ETW, 2000)

Defect Detection from Visual Abnormalities in Manufacturing Process Using IDDQ. - Masaru Sanada (J. Electron. Test., 2001)

Layout-Based Detection Technique of Line Pairs with Bridging Fault Using IDDQ. - Masaru Sanada (IEICE Trans. Inf. Syst., 2004)

Defect Diagnosis - Reasoning Methodology. - Yasuo Sato; Kazushi Sugiura; Reisuke Shimoda; Yutaka Yoshizawa; Kenji Norimatsu; Masaru Sanada (ATS, 2006)

Fault diagnosis technology based on transistor behavior analysis for physical analysis. - Masaru Sanada; Yutaka Yoshizawa (Microelectron. Reliab., 2006)

Voltage-based fault path tracing by transistor operating point analysis. - Masaru Sanada (Microelectron. Reliab., 2008)