A Calculus of Testability Measure at the Functional Level. - Shigeru Takasaki; Masato Kawai; Shigehiro Funatsu; Akihiko Yamada (ITC, 1981)

A High Level Test Pattern Generation Algorithm. - Masato Kawai; Hideo Shibano; Shigehiro Funatsu; Shunichi Kato; T. Kurobe; K. Ookawa; Tohru Sasaki (ITC, 1983)

An experimental MOS fault simulation program CSASIM. - Masato Kawai; John P. Hayes (DAC, 1984)

An AC/DC Test Generation System for Gate Array LSIs. - T. Shimono; K. Oozeki; M. Takahashi; Masato Kawai; Shigehiro Funatsu (ITC, 1985)

An Automatic Test-Generation System for Large Digital Circuits. - Shigehiro Funatsu; Masato Kawai (IEEE Des. Test, 1985)

Test Data Quality Assurance. - Masato Kawai; T. Shimono; Shigehiro Funatsu (ITC, 1986)

Testing for a Solid-State Color Image Sensor. - T. Noguchi; Atsushi Murakami; Masato Kawai; Y. Hayasaka (ITC, 1986)

System Level Fault Dictionary Generation. - Hidetoshi Tanaka; Masato Kawai; Izumi Sugasaki; Tadanobu Hakuba (ITC, 1988)

Scan design at NEC. - Shigehiro Funatsu; Masato Kawai; Akihiko Yamada (IEEE Des. Test, 1989)

An Efficient Algorithm for RTL Power Macro-Modeling and Library Building. - Masaaki Ohtsuki; Masato Kawai; Masahiro Fukui (IEICE Trans. Electron., 2009)

Coaxial needle insertion assistant for epidural puncture effect of lateral force on needle. - Yoshihiko Koseki; Masato Kawai; Danilo De Lorenzo; Yasushi Yamauchi; Kiyoyuki Chinzei (EMBC, 2013)

Free-viewpoint Sports Video Generation Based on Dynamic NeRF Considering Time Series. - Masato Kawai; Rintaro Yanagi; Ren Togo; Takahiro Ogawa 001; Miki Haseyama (GCCE, 2022)

AMDIS: Amplitude Dissimilarity Reduced Reference IQA Metric for Neural Radiance Field. - Ren Togo; Rintaro Yanagi; Masato Kawai; Takahiro Ogawa 001; Miki Haseyama (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2025)