Low-Cost Hardening of Image Processing Applications Against Soft Errors. - Ilia Polian; Bernd Becker 001; Masato Nakasato; Satoshi Ohtake; Hideo Fujiwara (DFT, 2006)

Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability. - Masato Nakasato; Satoshi Ohtake; Kewal K. Saluja; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2007)

Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. - Masato Nakasato; Michiko Inoue; Satoshi Ohtake; Hideo Fujiwara (IEICE Trans. Inf. Syst., 2008)