Laser THz emission microscope as a novel tool for LSI failure analysis. - Masatsugu Yamashita; Chiko Otani; Sunmi Kim; Hironaru Murakami; Masayoshi Tonouchi; Toru Matsumoto 002; Yoshihiro Midoh; Katsuyoshi Miura; Koji Nakamae; Kiyoshi Nikawa (Microelectron. Reliab., 2009)

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. - Kiyoshi Nikawa; Masatsugu Yamashita; Toru Matsumoto 002; Katsuyoshi Miura; Yoshihiro Midoh; Koji Nakamae (Microelectron. Reliab., 2011)