On effective criterion of path selection for delay testing. - Masayasu Fukunaga; Seiji Kajihara; Sadami Takeoka; Shinichi Yosimura (ASP-DAC, 2003)

On Estimation of Fault Efficiency for Path Delay Faults. - Masayasu Fukunaga; Seiji Kajihara; Sadami Takeoka (Asian Test Symposium, 2003)

Evaluation of Delay Testing Based on Path Selection. - Masayasu Fukunaga; Seiji Kajihara; Sadami Takeoka; Shinichi Yoshimura (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003)

Path delay test compaction with process variation tolerance. - Seiji Kajihara; Masayasu Fukunaga; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (DAC, 2005)

On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis. - Masayasu Fukunaga; Seiji Kajihara; Sadami Takeoka (IEICE Trans. Inf. Syst., 2005)

A dynamic test compaction procedure for high-quality path delay testing. - Masayasu Fukunaga; Seiji Kajihara; Xiaoqing Wen; Toshiyuki Maeda; Shuji Hamada; Yasuo Sato (ASP-DAC, 2006)

Estimation of Delay Test Quality and Its Application to Test Generation. - Seiji Kajihara; Shohei Morishima; Masahiro Yamamoto; Xiaoqing Wen; Masayasu Fukunaga; Kazumi Hatayama; Takashi Aikyo (IPSJ Trans. Syst. LSI Des. Methodol., 2008)