Reliable Threshold Voltage Determination for Sub-0.1µm Gate Length MOSFET's. - Morikazu Tsuno; Masato Suga; Masayasu Tanaka; Kentaro Shibahara; Mitiko Miura-Mattausch; Masataka Hirose (ASP-DAC, 1998)

High performance of short-channel MOSFETs due to an elevated central-channel doping. - Masayasu Tanaka; N. Tokida; T. Okagaki; Mitiko Miura-Mattausch; Walter Hansch; Hans Jürgen Mattausch (ASP-DAC, 2000)

Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design. - Kazuya Hisamitsu; Hiroaki Ueno; Masayasu Tanaka; Daisuke Kitamaru; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Shigetaka Kumashiro; Tetsuya Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (ASP-DAC, 2003)