A Statistical Model for Assessing the Fault Tolerance of Variable Switching Currents for a 1Gb Spin Transfer Torque Magnetoresistive Random Access Memory. - Yoshiaki Asao; Masayoshi Iwayama; Kenji Tsuchida; Akihiro Nitayama; Hiroaki Yoda; Hisanori Aikawa; Sumio Ikegawa; Tatsuya Kishi (DFT, 2008)

A 64Mb MRAM with clamped-reference and adequate-reference schemes. - Kenji Tsuchida; Tsuneo Inaba; Katsuyuki Fujita; Yoshihiro Ueda; Takafumi Shimizu; Yoshiaki Asao; Takeshi Kajiyama; Masayoshi Iwayama; Kuniaki Sugiura; Sumio Ikegawa; Tatsuya Kishi; Tadashi Kai; et al. (ISSCC, 2010)