Optimization problems for plasma-induced damage - A concept for plasma-induced damage design. - Koji Eriguchi; Yoshinori Nakakubo; Asahiko Matsuda; Masayuki Kamei; Yoshinori Takao; Kouichi Ono (ICICDT, 2012)

Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs. - Masayuki Kamei; Yoshinori Takao; Koji Eriguchi; Kouichi Ono (ICICDT, 2014)