A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. - Claudio Turchetti; P. Prioretti; Guido Masetti; E. Profumo; Massimo Vanzi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986)

An Extension to Newton's Method in Device Simulators–On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. - Zhiping Yu; Robert W. Dutton; Massimo Vanzi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987)

A physically based mobility model for numerical simulation of nonplanar devices. - Claudio Lombardi; Stefano Manzini; Antonio Saporito; Massimo Vanzi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Measurement of the local latch-up sensitivity by means of computer-controller scanning electron microscopy. - Claudio Canali; Manuela Giannini; Andrea Scorzoni; Massimo Vanzi; Enrico Zanoni (IEEE J. Solid State Circuits, 1988)

Editorial. - Daniel L. Barton; Shigeru Nakajima; Massimo Vanzi (Microelectron. Reliab., 2001)

Damp Heat test on LiNbO optical modulators. - Paola Furcas; Rosaria De Palo; Maria Elena Patella; Giulia Salmini; Massimo Vanzi (Microelectron. Reliab., 2001)

Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs. - Gaudenzio Meneghesso; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2001)

A specimen-current branching approach for FA of long Electromigration test lines. - C. Caprile; Ilaria De Munari; Maurizio Impronta; Simona Podda; Andrea Scorzoni; Massimo Vanzi (Microelectron. Reliab., 2002)

Editorial. - Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2002)

An automated lifetest equipment for optical emitters. - M. Giglio; G. Martines; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

Backside Failure Analysis of GaAs ICs after ESD tests. - Gaudenzio Meneghesso; A. Cocco; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. - Luca Sponton; Lorenzo Cerati; Giuseppe Croce; Giovanna Mura; Simona Podda; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2002)

Reliability tests on WDM filters. - Massimo Vanzi; Giulia Salmini; R. Pastorelli; S. Pessina; Paola Furcas (Microelectron. Reliab., 2002)

Reliability of visible GaN LEDs in plastic package. - Gaudenzio Meneghesso; S. Levada; Enrico Zanoni; Gaetano Scamarcio; Giovanna Mura; Simona Podda; Massimo Vanzi; S. Du; I. Eliashevich (Microelectron. Reliab., 2003)

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. - Giovanna Mura; Massimo Vanzi; Maria Stangoni; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2003)

Failure analysis of RFIC amplifiers. - Giovanna Mura; Massimo Vanzi; G. Micheletti (Microelectron. Reliab., 2004)

Quantitative 3D reconstruction from BS imaging. - Ruggero Pintus; Simona Podda; Francesca Mighela; Massimo Vanzi (Microelectron. Reliab., 2004)

Failure Analysis of RuO2 Thick Film Chip Resistors. - Simona Podda; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2004)

Video Streaming in Electron Microscopy Applications. - Francesca Mighela; Cristian Perra; Massimo Vanzi (VLBV, 2005)

Reliability predictions in electronic industrial applications. - G. Cassanelli; Giovanna Mura; F. Cesaretti; Massimo Vanzi; Fausto Fantini (Microelectron. Reliab., 2005)

Image alignment for 3D reconstruction in a SEM. - Ruggero Pintus; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2005)

Failure Analysis-assisted FMEA. - G. Cassanelli; Giovanna Mura; Fausto Fantini; Massimo Vanzi; Bernard Plano (Microelectron. Reliab., 2006)

High brightness GaN LEDs degradation during dc and pulsed stress. - Matteo Meneghini; Simona Podda; A. Morelli; Ruggero Pintus; L. Trevisanello; Gaudenzio Meneghesso; Massimo Vanzi; Enrico Zanoni (Microelectron. Reliab., 2006)

Life begins at 65: unless you are mixed signal? - Reimund Wittmann; Massimo Vanzi; Hans-Joachim Wassener; Navraj Nandra; Joachim Kunkel; José E. da Franca; Christian Münker (DATE, 2007)

High temperature electro-optical degradation of InGaN/GaN HBLEDs. - Matteo Meneghini; Lorenzo Trevisanello; C. Sanna; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2007)

A model for the DC characteristics of a laser diode. - Massimo Vanzi (ICECS, 2008)

Sulfur-contamination of high power white LED. - Giovanna Mura; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2008)

An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy. - Ruggero Pintus; Simona Podda; Massimo Vanzi (IEEE Trans. Instrum. Meas., 2008)

Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. - Giovanna Mura; Massimo Vanzi (Microelectron. Reliab., 2009)

The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. - Giovanna Mura; Massimo Vanzi (Microelectron. Reliab., 2010)

Editorial. - Massimo Vanzi (Microelectron. Reliab., 2010)

An original DoE-based tool for silicon photodetectors EoL estimation in space environments. - Piero Spezzigu; Laurent Béchou; Gianandrea Quadri; Olivier Gilard; Yves Ousten; Massimo Vanzi (Microelectron. Reliab., 2011)

DC parameters for laser diodes from experimental curves. - Massimo Vanzi; Giovanna Mura; G. Martines (Microelectron. Reliab., 2011)

Phosphors for LED-based light sources: Thermal properties and reliability issues. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Chip and package-related degradation of high power white LEDs. - Matteo Meneghini; Matteo Dal Lago; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. - Alessandro Compagnin; Matteo Meneghini; Marco Barbato; Valentina Giliberto; Andrea Cester; Massimo Vanzi; Giovanna Mura; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2013)

"Hot-plugging" of LED modules: Electrical characterization and device degradation. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

The role of the optical trans-characteristics in laser diode analysis. - Giovanna Mura; Massimo Vanzi; Giulia Marcello; Robert Cao (Microelectron. Reliab., 2013)

Optical losses in single-mode laser diodes. - Massimo Vanzi; Giovanna Mura; M. Marongiu; T. Tomasi (Microelectron. Reliab., 2013)

XEBIC at the Dual Beam. - Massimo Vanzi; Simona Podda; Elodia Musu; Robert Cao (Microelectron. Reliab., 2013)

FIB-induced electro-optical alterations in a DFB InP laser diode. - Giovanna Mura; Massimo Vanzi; Giulia Marcello (Microelectron. Reliab., 2014)

Recent improvements in photometric stereo for rock art 3D imaging. - Riccardo Dessì; Carla Mannu; Giuseppe Rodriguez; Giuseppa Tanda; Massimo Vanzi (Digit. Appl. Archaeol. Cult. Heritage, 2015)

Clamp voltage and ideality factor in laser diodes. - Massimo Vanzi; Giovanna Mura; Giulia Marcello; G. Martines (Microelectron. Reliab., 2015)

ESD tests on 850 nm GaAs-based VCSELs. - Massimo Vanzi; Giovanna Mura; Giulia Marcello; Kunhui Xiao (Microelectron. Reliab., 2016)

Practical optical gain by an extended Hakki-Paoli method. - Massimo Vanzi; Giulia Marcello; Giovanna Mura; G. Le Galès; S. Joly; Yannick Deshayes; Laurent Béchou (Microelectron. Reliab., 2017)

Further improvements of an extended Hakki-Paoli method. - Massimo Vanzi; Giovanna Mura; G. Martines (Microelectron. Reliab., 2018)

Identifying the lights position in photometric stereo under unknown lighting. - Anna Concas; Riccardo Dessì; Caterina Fenu; Giuseppe Rodriguez; Massimo Vanzi (ICCSA (Workshops), 2021)