Radiation hardening by design: A novel gate level approach. - Massoud Mokhtarpour Ghahroodi; Mark Zwolinski; Emre Özer 001 (AHS, 2011)

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. - Massoud Mokhtarpour Ghahroodi; Mark Zwolinski; Rick Wong; Shi-Jie Wen (ETS, 2011)

In-Field Logic Repair of Deep Sub-Micron CMOS Processors. - Massoud Mokhtarpour Ghahroodi; Mark Zwolinski (CoRR, 2015)