Integrating boundary scan test into an ASIC design flow. - Math Muris (ITC, 1990)

Using Boundary Scan Test to Test Random Access Memory Clusters. - Math Muris; Alex S. Biewenga (ITC, 1993)

Testing a multichip package for a consumer communications application. - Alex S. Biewenga; Math Muris; Rodger Schuttert; Urs Fawer (ITC, 1998)