Similarity-based Feedback Control for Linear Operation of Piezoelectric Actuators. - Mathias Poik; Dominik Kohl; Georg Schitter (AIM, 2018)

Efficient Demodulation for Measuring the Amplitude of Mechanical Oscillations. - Mathias Poik; Dominik Kohl; Mario Mayr; Christoph Kerschner; Georg Schitter (I2MTC, 2020)

Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff. - Shingo Ito; Mathias Poik; Johannes Schlarp; Georg Schitter (IEEE Trans. Ind. Electron., 2021)

A Mechatronic Lock-In Amplifier: Integrating Demodulation in Sensor Electronics for Measuring Mechanical Oscillations. - Mathias Poik; Dominik Kohl; Mario Mayr; Christoph Kerschner; Georg Schitter (IEEE Trans. Instrum. Meas., 2021)

Electrostatic Actuation of AFM Cantilevers in Aqueous Solutions. - Thomas Hackl; Mathias Poik; Georg Schitter (AIM, 2022)

DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. - Thomas Hackl; Mathias Poik; Georg Schitter (I2MTC, 2022)

Mechatronic Demodulation for Dynamic Atomic Force Microscopy Measurement Modes. - Mathias Poik; Mario Mayr; Thomas Hackl; Georg Schitter (I2MTC, 2022)

Quantitative Surface Potential Measurements by AC Electrostatic Force Microscopy. - Thomas Hackl; Mathias Poik; Georg Schitter (I2MTC, 2023)

Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing. - Mathias Poik; Thomas Hackl; Stefano Di Martino; Martin Schober; Jin Dang; Georg Schitter (I2MTC, 2023)

Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids. - Thomas Hackl; Mathias Poik; Georg Schitter (IEEE Trans. Instrum. Meas., 2023)

Model-Based RF Sensing for Contactless High-Resolution Voltage Measurements. - Mathias Poik; Thomas Hackl; Stefano Di Martino; Martin Schober; Jin Dang; Georg Schitter (IEEE Trans. Instrum. Meas., 2023)

Single-Harmonic Response Open-Loop Kelvin-Probe Force Microscopy. - Thomas Hackl; Mathias Poik; Georg Schitter (IEEE Trans. Instrum. Meas., 2024)