Automated Electron Beam Testing of VLSI Circuits. - P. Köllensperger; A. Krupp; Mathias Sturm; R. Weyl; F. Widulla; Eckhard Wolfgang (ITC, 1984)

Electron Beam Tester Integrated into a VLSI Tester. - Hironobu Niijima; Yasuo Tokunaga; Shouichi Koshizuka; Kazuo Yakuwa; Péter Fazekas; Mathias Sturm; Hans-Peter Feuerbaum (ITC, 1988)