Methodology for Dynamic Power Verification of Contactless Smartcards. - Julien Mercier; Christian Dufaza; Mathieu Lisart (PATMOS, 2006)

Signoff power methodology for contactless smartcards. - Julien Mercier; Christian Dufaza; Mathieu Lisart (ISLPED, 2007)

Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. - Thomas Ordas; Mathieu Lisart; Etienne Sicard; Philippe Maurine; Lionel Torres (PATMOS, 2008)

Electrical modeling of the effect of beam profile for pulsed laser fault injection. - C. Godlewski; Vincent Pouget; Dean Lewis; Mathieu Lisart (Microelectron. Reliab., 2009)

Modeling Time Domain Magnetic Emissions of ICs. - Victor Lomné; Philippe Maurine; Lionel Torres; Thomas Ordas; Mathieu Lisart; Jérome Toublanc (PATMOS, 2010)

Local and Direct EM Injection of Power Into CMOS Integrated Circuits. - François Poucheret; Karim Tobich; Mathieu Lisart; Laurent Chusseau; Bruno Robisson; Philippe Maurine (FDTC, 2011)

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology. - Alexandre Sarafianos; Roxane Llido; Jean-Max Dutertre; Olivier Gagliano; Valerie Serradeil; Mathieu Lisart; Vincent Goubier; Assia Tria; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)

Robustness improvement of an SRAM cell against laser-induced fault injection. - Alexandre Sarafianos; Mathieu Lisart; Olivier Gagliano; Valerie Serradeil; Cyril Roscian; Jean-Max Dutertre; Assia Tria (DFTS, 2013)

Voltage Spikes on the Substrate to Obtain Timing Faults. - Karim Tobich; Philippe Maurine; Pierre-Yvan Liardet; Mathieu Lisart; Thomas Ordas (DSD, 2013)

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell. - Alexandre Sarafianos; Cyril Roscian; Jean-Max Dutertre; Mathieu Lisart; Assia Tria (Microelectron. Reliab., 2013)

Laser attacks on integrated circuits: From CMOS to FD-SOI. - Jean-Max Dutertre; Stephan De Castro; Alexandre Sarafianos; Noemie Boher; Bruno Rouzeyre; Mathieu Lisart; Joel Damiens; Philippe Candelier; Marie-Lise Flottes; Giorgio Di Natale (DTIS, 2014)

Laser-induced fault effects in security-dedicated circuits. - Régis Leveugle; Paolo Maistri; Pierre Vanhauwaert; Feng Lu; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Athanasios Papadimitriou; David Hély; Vincent Beroulle; Guillaume Hubert; Stephan De Castro; et al. (VLSI-SoC, 2014)

Electromagnetic analysis and fault injection onto secure circuits. - Paolo Maistri; Régis Leveugle; Lilian Bossuet; Alain Aubert; Viktor Fischer; Bruno Robisson; Nicolas Moro; Philippe Maurine; Jean-Max Dutertre; Mathieu Lisart (VLSI-SoC, 2014)

Influence of triple-well technology on laser fault injection and laser sensor efficiency. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Alexandre Sarafianos; Jean-Max Dutertre (DFTS, 2015)

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (DFTS, 2015)

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (IOLTS, 2015)

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Mathieu Lisart; Alexandre Sarafianos; Edith Kussener; Wenceslas Rahajandraibe; Jean-Max Dutertre (IRPS, 2015)

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Jean-Max Dutertre; Alexandre Sarafianos (Microelectron. Reliab., 2015)

Electromagnetic Fault Injection : How Faults Occur. - Mathieu Dumont; Mathieu Lisart; Philippe Maurine (FDTC, 2019)

Modeling and Simulating Electromagnetic Fault Injection. - Mathieu Dumont; Mathieu Lisart; Philippe Maurine (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)