Characterization and Test of Intermittent Over RESET in RRAMs. - Hanzhi Xun; Moritz Fieback; Sicong Yuan; Hassen Aziza; Mathijs Heidekamp; Thiago Copetti; Letícia Maria Veiras Bolzani Poehls; Mottaqiallah Taouil; Said Hamdioui (ATS, 2023)