BEOL Process Development Using Fast Power Cycling on Test Structures. - Matt Ring; Johan De Greve; Bill Cowell; Darren Moore; Jeff Gambino (IRPS, 2019)

Assessing SiCr resistor drift for automotive analog ICs. - Kevin A. Stewart; Keiichi Kimura; Matt Ring; Koen Noldus; Pat Hulse; Rick C. Jerome; Akihiro Hasegawa; Jeff P. Gambino; David T. Price (IRPS, 2021)

Revealing stresses for plasma induced damage detection in thick oxides. - Daniel Beckmeier; Jifa Hao; Jake Choi; Matt Ring (IRPS, 2022)