A microscopic physical description of RTN current fluctuations in HfOx RRAM. - Francesco Maria Puglisi; Paolo Pavan; Luca Vandelli; Andrea Padovani; Matteo Bertocchi; Luca Larcher (IRPS, 2015)

Variability sources and reliability of 3D - FeFETs. - Milan Pesic; Bastien Beltrando; Andrea Padovani; Shruba Gangopadhyay; Muthukumar Kaliappan; Michael Haverty; Marco A. Villena; Enrico Piccinini; Matteo Bertocchi; Tony Chiang; Luca Larcher; Jack Strand; et al. (IRPS, 2021)