Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. - Carlo De Santi; Matteo Meneghini; Michael Marioli; Matteo Buffolo; Nicola Trivellin; T. Weig; K. Holc; K. Köhler; J. Wagner; U. T. Schwarz; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

Analysis of the mechanisms limiting the reliability of retrofit LED lamps. - Carlo De Santi; Matteo Dal Lago; Matteo Buffolo; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni (RTSI, 2015)

Long-term degradation mechanisms of mid-power LEDs for lighting applications. - Matteo Buffolo; Carlo De Santi; Matteo Meneghini; D. Rigon; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2015)

Failure causes and mechanisms of retrofit LED lamps. - Carlo De Santi; Matteo Dal Lago; Matteo Buffolo; Desiree Monti; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2015)

Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs. - Matteo Buffolo; Matteo Meneghini; Carlo De Santi; Henry Felber; N. Renso; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2016)

Understanding the degradation processes of GaN based LEDs submitted to extremely high current density. - N. Renso; Matteo Meneghini; Matteo Buffolo; Carlo De Santi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2017)

Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. - Matteo Buffolo; M. Pietrobon; Carlo De Santi; F. Samparisi; Michael L. Davenport; John E. Bowers 001; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)

Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress. - N. Renso; Matteo Buffolo; Carlo De Santi; Matteo Ronzani; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)

Current induced degradation study on state of the art DUV LEDs. - Nicola Trivellin; Desiree Monti; Carlo De Santi; Matteo Buffolo; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)

Current crowding as a major cause for InGaN LED degradation at extreme high current density. - Nicola Trivellin; Matteo Buffolo; Carlo De Santi; Enrico Zanoni; Gaudenzio Meneghesso; Matteo Meneghini (IECON, 2021)

Full Optical Contactless Thermometry Based on LED Photoluminescence. - Nicola Trivellin; Matteo Buffolo; Carlo De Santi; Matteo Meneghini; Michele Forzan; Fabrizio Dughiero; Enrico Zanoni; Gaudenzio Meneghesso (IEEE Trans. Instrum. Meas., 2021)

Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes. - Alexander Herzog; Simon Benkner; Babak Zandi; Matteo Buffolo; Willem D. van Driel; Matteo Meneghini; Tran Quoc Khanh (IEEE Access, 2023)