28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. - Alessandro Grossi; Matteo Coppetta; Stefano Aresu; Andreas Kux; Thomas Kern; Robert Strenz (IMW, 2023)

A graph-based algorithm for NVM address decoders testing. - Pierre Scaramuzza; Thomas Kern; Matteo Coppetta; Alessandro Grossi; Rudolf Ullmann (ITC, 2024)