FIB/TEM analysis supported by μ-probing approach to identify via marginality. - Marco Sanna; Matteo Medda (Microelectron. Reliab., 2012)

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. - Riccardo Enrici Vaion; Matteo Medda; Alberto Mancaleoni; Giovanna Mura; A. Pintus; M. De Tomasi (Microelectron. Reliab., 2017)

Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study. - Giulia Marcello; Eleonora Meda; Matteo Medda (Microelectron. Reliab., 2018)