On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale. - Matthew Drallmeier; Yujie Zhou; Elyse Rosenbaum (IRPS, 2024)

TDDB Characterization of High-k Gate Dielectric on a Sub-nanosecond Timescale. - Matthew Drallmeier; Elyse Rosenbaum (IRPS, 2025)