Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring. - Matthew J. Lynch; Ryan Jacobs; Gabriella Bruno; Priyam Patki; Dane Morgan; Kevin G. Field (CoRR, 2024)

Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests. - Ni Li; Ryan Jacobs; Matthew J. Lynch; Vidit Agrawal; Kevin G. Field; Dane Morgan (CoRR, 2025)