Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions. - Matthew L. Fichtenbaum (ITC, 1982)

Scan test architectures for digital board testers. - Matthew L. Fichtenbaum; Gordon D. Robinson (J. Electron. Test., 1991)

A VXI Driver-Sensor Instrument with Large Tester Architecture. - Matthew L. Fichtenbaum; Robert J. Muller (ITC, 1992)