Reliable Low-Voltage FeRAM Capacitors for High-Speed Dense Embedded Memory in Advanced CMOS. - Sou-Chi Chang; Christopher Neumann; Bernal Granados Alpizar; Sarah Atanasov; Jason Peck; Nafees Kabir; Yu-Ching Liao; Shriram Shivaraman; Wriddhi Chakraborty; Nazila Haratipour; I-Cheng Tung; V. Nikitin; et al. (VLSI Technology and Circuits, 2024)