DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. - Mike W. T. Wong; Matthew Worsman (Asian Test Symposium, 1998)

Nonlinear circuit fault diagnosis with large change sensitivity. - Matthew Worsman; Mike W. T. Wong (ICECS, 1998)

Analog circuit equivalent faults in the D.C. domain. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (Asian Test Symposium, 2000)

A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (ISQED, 2000)

Non‐linear analog circuit fault diagnosis with large change sensitivity. - Matthew Worsman; Mike W. T. Wong (Int. J. Circuit Theory Appl., 2000)

The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (ETW, 2001)

Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (DELTA, 2002)