Leakage current and defect characterization of p+n-source/drain diodes. - Guntrade Roll; Matthias Goldbach; Lothar Frey (Microelectron. Reliab., 2011)

SRAM read current variability and its dependence on transistor statistics. - Sriramkumar Venugopalan; Vivek Joshi; Luis Zamudio; Matthias Goldbach; Gert Burbach; Ralf Van Bentum; Sriram Balasubramanian (CICC, 2013)