FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. - Sybille Hellebrand; Thomas Indlekofer; Matthias Kampmann; Michael A. Kochte; Chang Liu 010; Hans-Joachim Wunderlich (ITC, 2014)

Optimized Selection of Frequencies for Faster-Than-at-Speed Test. - Matthias Kampmann; Michael A. Kochte; Eric Schneider; Thomas Indlekofer; Sybille Hellebrand; Hans-Joachim Wunderlich (ATS, 2015)

X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. - Matthias Kampmann; Sybille Hellebrand (ATS, 2016)

Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. - Matthias Kampmann; Sybille Hellebrand (DDECS, 2017)

Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. - Chang Liu 010; Eric Schneider; Matthias Kampmann; Sybille Hellebrand; Hans-Joachim Wunderlich (ATS, 2018)

A "Laboratory" as an approach to foster writing skills at software engineering studies: Learning software engineering is easier when writing courses are directly applied to lecture's content and the problems and examples enrolled in. - Matthias Kampmann; Jürgen Mottok (EDUCON, 2018)

Design for Small Delay Test - A Simulation Study. - Matthias Kampmann; Sybille Hellebrand (Microelectron. Reliab., 2018)

Built-In Test for Hidden Delay Faults. - Matthias Kampmann; Michael A. Kochte; Chang Liu 010; Eric Schneider; Sybille Hellebrand; Hans-Joachim Wunderlich (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Logic Fault Diagnosis of Hidden Delay Defects. - Stefan Holst; Matthias Kampmann; Alexander Sprenger; Jan Dennis Reimer; Sybille Hellebrand; Hans-Joachim Wunderlich; Xiaoqing Wen (ITC, 2020)

High-Bandwidth IJTAG over SSN. - Jonathan Gaudet; Jan Burchard; Matthias Kampmann; Jean-François Côté; Tim Callahan; Hung Ho Chai; Ivy Ee Hsia Lim; Lori Schramm; Olga Przybysz; Marta Stepniewska; Sascha Ochsenknecht; Michal Olejarz; et al. (ITC, 2024)