Analysis of propagation delays in high-speed VLSI circuits using a distributed line model. - Matthias Passlack; Manfred Uhle; Horst Elschner (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990)

Optical measurement system for characterizing compound semiconductor interface and surface states. - Matthias Passlack; Ronald N. Legge; Diana Convey; Zhiyi Yu; Jonathan K. Abrokwah (IEEE Trans. Instrum. Meas., 1998)

Building high performance transistors on carbon nanotube channel. - Gregory Pitner; Nathaniel Safron; Tzu-Ang Chao; Shengman Li; Sheng-Kai Su; Gilad Zeevi; Qing Lin; Hsin-Yuan Chiu; Matthias Passlack; Zichen Zhang 019; D. Mahaveer Sathaiya; Aslan Wei; et al. (VLSI Technology and Circuits, 2023)

High Performance Transistor of Aligned Carbon Nanotubes in a Nanosheet Structure. - Nathaniel Safron; Tzu-Ang Chao; Shengman Li; Shreyam Natani; San Lin Liew; Carlo Gilardi; Hsin-Yuan Chiu; Sheng-Kai Su; Andrew Bechdolt; Gilad Zeevi; Zichen Zhang 019; Matthias Passlack; et al. (VLSI Technology and Circuits, 2024)