Modelling spatio-temporal variability of temperature. - Xiaofeng Cao; Ostap Okhrin; Martin Odening; Matthias Ritter (Comput. Stat., 2015)

Aging sensors for on-chip metallization of integrated LDMOS transistors under cyclic thermo-mechanical stress. - Matthias Ritter; Martin Pfost (Microelectron. Reliab., 2017)