Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. - Sergey Bychikhin; Martin Litzenberger; R. Pichler; Dionyz Pogany; Erich Gornik; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2001)

Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology. - Harald Gossner; T. Müller-Lynch; Kai Esmark; Matthias Stecher (Microelectron. Reliab., 2001)

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. - M. Blaho; Dionyz Pogany; Erich Gornik; Marie Denison; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2003)

Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Modeling and characterization of molding compound properties during cure. - Kaspar M. B. Jansen; C. Qian; Leo J. Ernst; C. Bohm; A. Kessler; Harald Preu; Matthias Stecher (Microelectron. Reliab., 2009)

System ESD robustness by co-design of on-chip and on-board protection measures. - Harald Gossner; Werner Simbürger; Matthias Stecher (Microelectron. Reliab., 2010)

Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. - A. Podgaynaya; Ralf Rudolf; B. Elattari; Dionyz Pogany; Erich Gornik; Matthias Stecher; Marc Strasser (Microelectron. Reliab., 2010)

On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). - Martin Sauter; Werner Simbürger; David Johnsson; Matthias Stecher (Microelectron. Reliab., 2011)

High voltage robustness of mold compounds under different environmental conditions. - Julie Paye; Albert Claudi; Matthias Stecher (IRPS, 2015)