Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices. - Matthias Wespel; Martina Baeumler; Vladimir Polyakov; Maximilian Dammann; Richard Reiner; Patrick Waltereit; Rüdiger Quay; Michael Mikulla; Oliver Ambacher (Microelectron. Reliab., 2014)

High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs. - Matthias Wespel; Maximilian Dammann; Vladimir Polyakov; Richard Reiner; Patrick Waltereit; B. Weiss; Rüdiger Quay; Michael Mikulla; Oliver Ambacher (IRPS, 2015)

Degradation of 0.25 μm GaN HEMTs under high temperature stress test. - Maximilian Dammann; Martina Baeumler; Peter Brückner; Wolfgang Bronner; Stephan Maroldt; Helmer Konstanzer; Matthias Wespel; Rüdiger Quay; Michael Mikulla; Andreas Graff; M. Lorenzini; M. Fagerlind; et al. (Microelectron. Reliab., 2015)