Cost-driven statistical analysis for selection of alternative measurements of analog circuits. - Matthieu Verdy; Alin Ratiu; Dominique Morche; Emeric de Foucauld; Suzanne Lesecq; Jean-Pascal Mallet; Cedric Mayor (ICECS, 2014)

Balancing test cost reduction vs. measurements accuracy at test time. - Matthieu Verdy; Dominique Morche; Emeric de Foucauld; Suzanne Lesecq; Jean-Pascal Mallet; Cedric Mayor (NEWCAS, 2015)