Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. - Eline Janssens; Jan De Beenhouwer; Mattias Van Dael; Pieter Verboven; Bart M. Nicolaï; Jan Sijbers (ICIP, 2015)

Inline discrete tomography system: Application to agricultural product inspection. - Luis Filipe Alves Pereira; Eline Janssens; George D. C. Cavalcanti; Ing Ren Tsang; Mattias Van Dael; Pieter Verboven; Bart M. Nicolaï; Jan Sijbers (Comput. Electron. Agric., 2017)