A structured and scalable mechanism for test access to embedded reusable cores. - Erik Jan Marinissen; Robert G. J. Arendsen; Gerard Bos; Hans Dingemanse; Maurice Lousberg; Clemens Wouters (ITC, 1998)

The role of test protocols in testing embedded-core-based system ICs. - Erik Jan Marinissen; Maurice Lousberg (ETW, 1999)

Static component interconnect test technology (SCITT) a new technology for assembly testing. - Alex S. Biewenga; Henk D. L. Hollmann; Frans G. M. de Jong; Maurice Lousberg (ITC, 1999)

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? - Will R. Moore; Guido Gronthoud; Keith Baker; Maurice Lousberg (ITC, 2000)

Wrapper design for embedded core test. - Yervant Zorian; Erik Jan Marinissen; Maurice Lousberg; Sandeep Kumar Goel (ITC, 2000)

CTL the language for describing core-based test. - Rohit Kapur; Maurice Lousberg; Tony Taylor; Brion L. Keller; Paul Reuter; Douglas Kay (ITC, 2001)

IP and Automation to Support IEEE P1500. - Dwayne Burek; Garen Darbinyan; Rohit Kapur; Maurice Lousberg; Teresa L. McLaurin; Mike Ricchetti (VTS, 2001)

An Effective Diagnosis Method to Support Yield Improvement. - Camelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg (ITC, 2002)

On IEEE P1500's Standard for Embedded Core Test. - Erik Jan Marinissen; Rohit Kapur; Maurice Lousberg; Teresa L. McLaurin; Mike Ricchetti; Yervant Zorian (J. Electron. Test., 2002)

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. - Ananta K. Majhi; Guido Gronthoud; Camelia Hora; Maurice Lousberg; Pop Valer; Stefan Eichenberger (VTS, 2003)

On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. - Camelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg (J. Electron. Test., 2003)

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing. - Tom Waayers; Erik Jan Marinissen; Maurice Lousberg (Asian Test Symposium, 2005)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (DATE, 2005)

Memory testing improvements through different stress conditions. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (ESSCIRC, 2005)

A New Algorithm for Dynamic Faults Detection in RAMs. - Mohamed Azimane; Ananta K. Majhi; Guido Gronthoud; Maurice Lousberg (VTS, 2005)

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Diagnosis of Full Open Defects in Interconnecting Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)