Cumulative embedded memory failure bitmap display & analysis. - Nicola Campanelli; Tamas Kerekes; Paolo Bernardi; Mauricio de Carvalho; Alessandro Panariti; Matteo Sonza Reorda; Davide Appello; Mario Barone (DDECS, 2010)

An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. - Mauricio de Carvalho; Paolo Bernardi; Ernesto Sánchez 001; Matteo Sonza Reorda (MTV, 2010)

Optimized embedded memory diagnosis. - Mauricio de Carvalho; Paolo Bernardi; Matteo Sonza Reorda; Nicola Campanelli; Tamas Kerekes; Davide Appello; Mario Barone; Vincenzo Tancorre; Marco Terzi (DDECS, 2011)

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing. - Miroslav Valka; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Ernesto Sánchez 001; Mauricio de Carvalho; Matteo Sonza Reorda (ETS, 2011)

Peak Power Estimation: A Case Study on CPU Cores. - Paolo Bernardi; Mauricio de Carvalho; Ernesto Sánchez 001; Matteo Sonza Reorda; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Miroslav Valka (Asian Test Symposium, 2012)

On-line software-based self-test of the Address Calculation Unit in RISC processors. - Paolo Bernardi; Lyl M. Ciganda; Mauricio de Carvalho; Michelangelo Grosso; Jorge Luis Lagos-Benites; Ernesto Sánchez 001; Matteo Sonza Reorda; Oscar Ballan (ETS, 2012)

Increasing fault coverage during functional test in the operational phase. - Mauricio de Carvalho; Paolo Bernardi; Ernesto Sánchez 001; Matteo Sonza Reorda; Oscar Ballan (IOLTS, 2013)

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption. - Paolo Bernardi; Mauricio de Carvalho; Ernesto Sánchez 001; Matteo Sonza Reorda; Alberto Bosio; Luigi Dilillo; Miroslav Valka; Patrick Girard 001 (J. Low Power Electron., 2013)

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test. - Mauricio de Carvalho; Paolo Bernardi; Ernesto Sánchez 001; Matteo Sonza Reorda; Oscar Ballan (J. Electron. Test., 2014)

Innovative Techniques for Testing and Diagnosing SoCs. - Mauricio de Carvalho (2015)