Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2017)

Towards understanding recovery of hot-carrier induced degradation. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (Microelectron. Reliab., 2018)

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices. - Maurits J. de Jong; Cora Salm; Jurriaan Schmitz (IRPS, 2020)