Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy. - Mauro Ciappa; Alexander Koschik; Maurizio Dapor; Wolfgang Fichtner (Microelectron. Reliab., 2010)

Threshold Quantum State Tomography. - Diego Maragnano; Daniele Binosi; Giovanni Garberoglio; Claudio Cusano; Maurizio Dapor; Marco Liscidini (ICTON, 2023)