A specimen-current branching approach for FA of long Electromigration test lines. - C. Caprile; Ilaria De Munari; Maurizio Impronta; Simona Podda; Andrea Scorzoni; Massimo Vanzi (Microelectron. Reliab., 2002)

An improved isothermal electromigration test for Cu-damascene characterization. - Maurizio Impronta; Sandro Farris; Andrea Scorzoni (Microelectron. Reliab., 2004)

Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests. - Alessandro Marras; Maurizio Impronta; Ilaria De Munari; M. G. Valentini; Andrea Scorzoni (Microelectron. Reliab., 2007)