Soft Errors induced by single heavy ions in Floating Gate memory arrays. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (DFT, 2005)

Erratic Effects of Irradiation in Floating Gate Memory Cells. - G. Cellere; Alessandro Paccagnella; Angelo Visconti; Mauro Bonanomi (IOLTS, 2006)

Impact of total dose on heavy-ion upsets in floating gate arrays. - Simone Gerardin; Marta Bagatin; Alessandro Paccagnella; G. Cellere; Angelo Visconti; Mauro Bonanomi (Microelectron. Reliab., 2010)

Comprehensive Reliability Assessment of 32Gb (Hf,Zr)O2-Based Ferroelectric NVDRAM. - Devanarayanan Ettisserry; Angelo Visconti; Mauro Bonanomi; Riccardo Pazzocco; Andrea Locatelli; Alessandro Sebastiani; Ashonita Chavan; Matthew Hollander; Giorgio Servalli; Alessandro Calderoni; Nirmal Ramaswamy (IRPS, 2024)