Macro Testing: Unifying IC and Board Test. - Frans P. M. Beenker; Karel J. E. van Eerdewijk; Robert B. W. Gerritsen; Frank N. Peacock; Max van der Star (IEEE Des. Test, 1986)

A Testability Strategy for Silicon Compilers. - Frans P. M. Beenker; Rob Dekker; Rudi Stans; Max van der Star (ITC, 1989)

Implementing Macro Test in Silicon Compiler Design. - Frans P. M. Beenker; Barry J. Dekker; Richard Stans; Max van der Star (IEEE Des. Test Comput., 1990)