High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. - Paolo Cova; Roberto Menozzi; Maximilian Dammann; T. Feltgen; W. Jantz (Microelectron. Reliab., 2002)

Reliability of Metamorphic HEMTs for Power Applications. - Maximilian Dammann; F. Benkhelifa; M. Meng; W. Jantz (Microelectron. Reliab., 2002)

Reliability of 70 nm metamorphic HEMTs. - Maximilian Dammann; Arnulf Leuther; Rüdiger Quay; M. Meng; Helmer Konstanzer; W. Jantz; Michael Mikulla (Microelectron. Reliab., 2004)

Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems. - Maximilian Dammann; W. Pletschen; Patrick Waltereit; Wolfgang Bronner; Rüdiger Quay; Stefan Müller; Michael Mikulla; Oliver Ambacher; P. J. van der Wel; S. Murad; T. Rödle; R. Behtash; et al. (Microelectron. Reliab., 2009)

Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs. - M. Cäsar; Maximilian Dammann; Vladimir Polyakov; Patrick Waltereit; Rüdiger Quay; Michael Mikulla; Oliver Ambacher (Microelectron. Reliab., 2011)

Qualification of 50 V GaN on SiC technology for RF power amplifiers. - P. J. van der Wel; T. Rödle; Benoit Lambert; Hervé Blanck; Maximilian Dammann (Microelectron. Reliab., 2013)

Sequential Atmospheric Pressure Plasma-Assisted Laser Ablation of Photovoltaic Cover Glass for Improved Contour Accuracy. - Christoph Gerhard; Maximilian Dammann; Stephan Wieneke; Wolfgang Viöl (Micromachines, 2014)

Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices. - Matthias Wespel; Martina Baeumler; Vladimir Polyakov; Maximilian Dammann; Richard Reiner; Patrick Waltereit; Rüdiger Quay; Michael Mikulla; Oliver Ambacher (Microelectron. Reliab., 2014)

High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs. - Matthias Wespel; Maximilian Dammann; Vladimir Polyakov; Richard Reiner; Patrick Waltereit; B. Weiss; Rüdiger Quay; Michael Mikulla; Oliver Ambacher (IRPS, 2015)

Degradation of 0.25 μm GaN HEMTs under high temperature stress test. - Maximilian Dammann; Martina Baeumler; Peter Brückner; Wolfgang Bronner; Stephan Maroldt; Helmer Konstanzer; Matthias Wespel; Rüdiger Quay; Michael Mikulla; Andreas Graff; M. Lorenzini; M. Fagerlind; et al. (Microelectron. Reliab., 2015)

Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications. - Maximilian Dammann; Martina Baeumler; Vladimir Polyakov; Peter Brückner; Helmer Konstanzer; Rüdiger Quay; Michael Mikulla; Andreas Graff; Michél Simon-Najasek (Microelectron. Reliab., 2017)

Influence of air pollutants on the lifetime of LEDs and analysis of degradation effects. - Andreas Zibold; Maximilian Dammann; Ralf Schmidt; Helmer Konstanzer; Michael Kunzer (Microelectron. Reliab., 2017)

Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology. - Maximilian Dammann; Martina Baeumler; Peter Brückner; Tobias Kemmer; Helmer Konstanzer; Andreas Graff; Michél Simon-Najasek; Rüdiger Quay (Microelectron. Reliab., 2018)

Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress. - Maximilian Dammann; Martina Baeumler; Tobias Kemmer; Helmer Konstanzer; Peter Brückner; Sebastian Krause; Andreas Graff; Michél Simon-Najasek (IRPS, 2021)