Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates. - Reza Sedaghat; Mayuri Kunchwar; Raha Abedi; M. Reza Javaheri (Microelectron. Reliab., 2006)

Dynamic behavior of resistive faults in nanometer technology. - Mayuri Kunchwar; Reza Sedaghat; Vadim Geurkov (Microelectron. Reliab., 2007)