Systematic Study of Process Impact on FinFET Reliability. - Rakesh Ranjan; Ki-Don Lee; Md Iqbal Mahmud; Mohammad Shahriar Rahman; Pavitra Ramadevi Perepa; Charles Briscoe LaRow; Caleb Dongkyun Kwon; Maihan Nguyen; Minhyo Kang; Ashish Kumar Jha 005; Ahmed Shariq; Shamas Musthafa Ummer; et al. (IRPS, 2021)

Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET. - Md Iqbal Mahmud; Rakesh Ranjan; Ki-Don Lee; Pavitra Ramadevi Perepa; Caleb Dongkyun Kwon; Seungjin Choo; Kihyun Choi (IRPS, 2022)

Polarity Dependence and Metal Density Impact on Multi-Layer Inter-Level TDDB for High Voltage Application. - Yinghong Zhao; Ki-Don Lee; Manisha Sharma; Joonah Yoon; Rakesh Ranjan; Md Iqbal Mahmud; Caleb Dongkyan Kwon; Myungsoo Yeo (IRPS, 2022)