Fault-Tolerant Grid-Based Solvers: Combining Concepts from Sparse Grids and MapReduce. - Jay Walter Larson; Markus Hegland; Brendan Harding; Stephen G. Roberts; Linda Stals; Alistair P. Rendell; Peter E. Strazdins; Md. Mohsin Ali; Christoph Kowitz; Ross H. Nobes; James Southern; Nicholas Wilson; et al. (ICCS, 2013)

Managing Complexity in the Parallel Sparse Grid Combination Technique. - Jay Walter Larson; Peter E. Strazdins; Markus Hegland; Brendan Harding; Stephen G. Roberts; Linda Stals; Alistair P. Rendell; Md. Mohsin Ali; James Southern (PARCO, 2013)

Application Level Fault Recovery: Using Fault-Tolerant Open MPI in a PDE Solver. - Md. Mohsin Ali; James Southern; Peter E. Strazdins; Brendan Harding (IPDPS Workshops, 2014)

Parallel binary reflected Gray code sequence generation on multicore architectures. - Md. Mohsin Ali; Shakila Khan Rumi (Int. J. Parallel Emergent Distributed Syst., 2014)

A fault-tolerant gyrokinetic plasma application using the sparse grid combination technique. - Md. Mohsin Ali; Peter E. Strazdins; Brendan Harding; Markus Hegland; Jay Walter Larson (HPCS, 2015)

Highly Scalable Algorithms for the Sparse Grid Combination Technique. - Peter E. Strazdins; Md. Mohsin Ali; Brendan Harding (IPDPS Workshops, 2015)

Application Fault Tolerance for Shrinking Resources via the Sparse Grid Combination Technique. - Peter E. Strazdins; Md. Mohsin Ali; Bert J. Debusschere (IPDPS Workshops, 2016)

Complex scientific applications made fault-tolerant with the sparse grid combination technique. - Md. Mohsin Ali; Peter E. Strazdins; Brendan Harding; Markus Hegland (Int. J. High Perform. Comput. Appl., 2016)

Design and analysis of two highly scalable sparse grid combination algorithms. - Peter E. Strazdins; Md. Mohsin Ali; Brendan Harding (J. Comput. Sci., 2016)

A parallel framework for software defect detection and metric selection on cloud computing. - Md. Mohsin Ali; Md. Shamsul Huda; Jemal H. Abawajy; Sultan Alyahya; Hmood Al-Dossari 001; John Yearwood (Clust. Comput., 2017)

A Framework for Software Defect Prediction and Metric Selection. - Md. Shamsul Huda; Sultan Alyahya; Md. Mohsin Ali; Shafiq Ahmad; Jemal H. Abawajy; Hmood Al-Dossari 001; John Yearwood (IEEE Access, 2018)