Exact fault simulation for systems on Silicon that protects each core's intellectual property. - Md. Saffat Quasem; Sandeep K. Gupta 001 (DATE, 2001)

Designing Multiple Scan Chains for Systems-on-Chip. - Md. Saffat Quasem; Sandeep K. Gupta 001 (Asian Test Symposium, 2003)

Benefits of a SoC-Specific Test Methodology. - Md. Saffat Quasem; Zhigang Jiang; Sandeep K. Gupta 001 (IEEE Des. Test Comput., 2003)

Designing Reconfigurable Multiple Scan Chains for Systems-on-Chip. - Md. Saffat Quasem; Sandeep K. Gupta 001 (VTS, 2004)