Failure and Attack Detection by Digital Sensors. - Md Toufiq Hasan Anik; Rachit Saini; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (ETS, 2020)

On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. - Md Toufiq Hasan Anik; Mohammad Ebrahimabadi; Hamed Pirsiavash; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (ICCD, 2020)

On the Effect of Aging on Digital Sensors. - Md Toufiq Hasan Anik; Sylvain Guilley; Jean-Luc Danger; Naghmeh Karimi (VLSID, 2020)

On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits. - Md Toufiq Hasan Anik; Bijan Fadaeinia; Amir Moradi 001; Naghmeh Karimi (ASP-DAC, 2021)

Testing and Reliability Enhancement of Security Primitives. - Md Toufiq Hasan Anik; Jean-Luc Danger; Omar Diankha; Mohammad Ebrahimabadi; Christoph Frisch; Sylvain Guilley; Naghmeh Karimi; Michael Pehl; Sofiane Takarabt (DFT, 2021)

Real-Time IC Aging Prediction via On-Chip Sensors. - Ke Huang 001; Md Toufiq Hasan Anik; Xinqiao Zhang; Naghmeh Karimi (ISVLSI, 2021)

Masked SABL: A Long Lasting Side-Channel Protection Design Methodology. - Bijan Fadaeinia; Md Toufiq Hasan Anik; Naghmeh Karimi; Amir Moradi 001 (IEEE Access, 2021)

Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. - Md Toufiq Hasan Anik; Mohammad Ebrahimabadi; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (J. Electron. Test., 2021)

Detecting Failures and Attacks via Digital Sensors. - Md Toufiq Hasan Anik; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Aging-Induced Failure Prognosis via Digital Sensors. - Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (ACM Great Lakes Symposium on VLSI, 2023)

Attacking Multi-Tenant FPGAs Without Manual Placement and Routing. - Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (ISVLSI, 2024)

On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments. - Md Toufiq Hasan Anik; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (IEEE Trans. Very Large Scale Integr. Syst., 2024)

Multi-modal Pre-silicon Evaluation of Hardware Masking Styles. - Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Wei Cheng 003; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (J. Electron. Test., 2024)

BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment. - Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (ETS, 2025)

TIGER: TrIaGing KEy Refreshing Frequency via Digital Sensors. - Md Toufiq Hasan Anik; Hasin Ishraq Reefat; Mohammad Ebrahimabadi; Javad Bahrami; Hossein Pourmehrani; Jean-Luc Danger; Sylvain Guilley; Naghmeh Karimi (SECRYPT, 2025)